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Determination of secondary phases in kesterite $Cu_{2}ZnSnS_{4}$ thin films by x-ray absorption near edge structure analysis

机译：通过X射线吸收近边缘结构分析确定钾长石$ Cu_ {2} ZnSnS_ {4} $薄膜中的第二相

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Just, J.; Lützenkirchen-Hecht, D.; Frahm, R.; Schorr, S.; Unold, T.;
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年度 2011
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1. Determination of secondary phases in kesterite Cu_2ZnSnS_4 thin films by x-ray absorption near edge structure analysis [J] . Justus Just, Dirk Lutzenkirchen-Hecht, Ronald Frahm, Applied Physics Letters . 2011,第26期

机译：X射线吸收近边缘结构分析法测定钾长石Cu_2ZnSnS_4薄膜中的第二相
2. Thin Film Structure of Tetraceno[2,3-b]thiophene Characterized by Grazing Incidence X-ray Scattering and Near-Edge X-ray Absorption Fine Structure Analysis [J] . Quan Yuan, Stefan C. B. Mannsfeld, Ming L. Tang, Journal of the American Chemical Society . 2008,第11期

机译：掠入射X射线散射和近边缘X射线吸收精细结构分析表征的四氢噻吩并[2,3-b]噻吩的薄膜结构
3. Surface Structure of MgO Thin Films Revealed from X-ray Reflectivity and Near-Edge X-ray Absorption Fine Structure Measurements [J] . Singh Jitendra Pal, Lim Weon Cheol, Lee Ik-Jae, Science of advanced materials . 2018,第9期

机译：从X射线反射率和近边缘X射线吸收精细结构测量揭示MgO薄膜的表面结构
4. X-RAY ABSORPTION NEAR EDGE STRUCTURE ANALYSIS OF CHROMIUM OXYNITRIDE THIN FILMS [C] . Jun Inoue, Tadachika Nakayama, Tsuneo Suzuki, TMS(The Minerals, Metals Materials Society) Annual Meeting . 2007

机译：铬氧氮化薄膜的X射线吸收近缘结构分析
5. X-ray absorption fine structure strain determination in thin films [D] . DeRose, Guy Arthur 1992

机译：薄膜的X射线吸收精细结构应变测定
6. Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure [O] . Bangmin Zhang, Jingsheng Chen, Ping Yang, -1

机译：偏振依赖性X射线吸收在边缘结构附近探测的Pr0.67Sr0.33MnO3薄膜中的应变松弛效应
7. Thin Film Structure of Tetraceno2,3-bthiophene Characterized by Grazing Incidence X-ray Scattering and Near-Edge X-ray Absorption Fine Structure Analysis [O] . -1

机译：四烯型薄膜结构2,3-B噻吩，其特征在于放牧入射X射线散射和近边缘X射线吸收细结构分析
8. Orientational Behavior of Thin Films of Poly(3-Methylthiophene) on Platinium: A FTIR And Near Edge X-Ray Absorption Fine Structure (NEXAFS) Study. [R] . Yang, X. Q., Chen, J., Hale, P. D., 1988

机译：聚（3-甲基噻吩）薄膜在platinium上的取向行为：FTIR和近边X射线吸收精细结构（NEXaFs）研究。

Determination of secondary phases in kesterite $Cu_{2}ZnSnS_{4}$ thin films by x-ray absorption near edge structure analysis

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